ScholarWorks@Hanyang University: Journal : IEEE International Reliability Physics Symposium Proceedings

IEEE International Reliability Physics Symposium Proceedings

Journal Title

IEEE International Reliability Physics Symposium Proceedings

ISSN

1541-7026

Publisher

Listed on(Coverage)

SJR	2002-2017;2019
SCOPUS	2017

Active

Article List

1 - 2 out of 2 results.

SCOPUS

Record-Low EOT(3.6Å) & Jleak(7×10-8A/cm2@0.8V) HZO by Dielectric-Selective Microwave Annealing Go to Link

Shin, Hunbeom; Kim, Giuk; Lee, Sujeong; Kang, Geonhyeong; Choi, Hyojun; Jung, Taeseung; Jeon, Sanghun; Kim, Hyung-Jun; Ahn, Jinho

ArticleIssue Date2025CitationIEEE International Reliability Physics Symposium Proceedings, pp 1 - 9

SCOPUS

The Opportunity of Anti-ferroelectrics in FeFET for Emerging Non-Volatile Memory Applications Go to Link

Choi, Hyojun; Kim, Giuk; Shin, Hunbeom; Nam, Yunseok; Jeon, Sanghun; Kim, Kwangsoo; Lim, Suhwan; Woo, Jongho; Kim, Wanki; Ha, Daewon, et al.

ArticleIssue Date2025CitationIEEE International Reliability Physics Symposium Proceedings, pp 1 - 6

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