ScholarWorks@Hanyang University: Journal : IEEE International SOI Conference

한국어
LIBRARY

IEEE International SOI Conference

Journal Title

IEEE International SOI Conference

ISSN

1078-621X

Publisher

Listed on(Coverage)

SJR	1999-2015
SCOPUS	2017;2020

Active

Article List

1 - 1 out of 1 results.

SCOPUS

Post-RTA effect on electrical characteristics of nano-scale strained Si grown on SiGe-on-insulator n-MOSFET Go to Link

Park, Jea-Gun; Shim, Tae-Hun; Lee, Gon-Sub; Cho, Won-Ju; Ahn, Chang-Geun

ArticleIssue Date2006CitationIEEE International SOI Conference, pp 47 - 48

RSS_1.0 RSS_2.0 ATOM_1.0

222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.