Byun, G.-S.; Kim, Y.; Kim, J.; Tam, S.-W.; Hsieh, H.-H.; Wu, P.-Y.; Jou, C.; Cong, J.; Reinman, G.; Chang, M.-C.F.
ArticleIssue Date2011CitationDigest of Technical Papers - IEEE International Solid-State Circuits Conference, pp.488 - 489PublisherInstitute of Electrical and Electronics Engineers Inc.