Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Error Rate-Based Log-Likelihood Ratio Processing for Low-Density Parity-Check Codes in DNA Storage

Authors
Lu, XiaozhouJeong, JaehoKim, Jae-WonNo, Jong-SeonPark, HosungNo, AlbertKim, Sunghwan
Issue Date
Sep-2020
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
DNA; Parity check codes; Error analysis; Decoding; Channel models; Encoding; Simulation; DNA storage; error correction codes; low-density parity-check (LDPC) codes; log-likelihood ratio (LLR); error rate
Citation
IEEE ACCESS, v.8, pp.162892 - 162902
Journal Title
IEEE ACCESS
Volume
8
Start Page
162892
End Page
162902
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/11588
DOI
10.1109/ACCESS.2020.3021700
ISSN
2169-3536
Abstract
Due to the advantages of high storage densities and longevity, DNA storage has become one of the attractive technologies for future data storage systems. However, the writing/reading cost is still high and more efficient techniques for DNA storage are required. In this paper, we propose improved log-likelihood ratio (LLR) processing schemes based on observed statistics for low-density parity-check (LDPC) code decoding to reduce reading cost while encoding schemes are kept unchanged. Due to the mismatch between the real channel and the observed statistics and also the limit of maximum decoder input value, scaling the magnitude of LLR can lead to a better error correcting performance. Therefore, we propose two strategies: 1) directly scaling LLRs and 2) scaling pairwise substitution error rates, which changes the magnitude of LLRs. We also suggest the relation between substitution error rate and scaling values in the strategies by using curve fitting methods. Simulation results show that the error correcting performance from the proposed LLR calculation is better than that from the conventional scheme. Finally, we verify that the proposed LLR methods can be generally applied in DNA storage systems, and present practical methods to calculate error rates.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electronic & Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE