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Editorial
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kwon | - |
| dc.contributor.author | H.-I. | - |
| dc.contributor.author | Cha, Hoyoung | - |
| dc.contributor.author | H.-Y. | - |
| dc.contributor.author | Choi | - |
| dc.contributor.author | W.Y. | - |
| dc.contributor.author | Yoon | - |
| dc.contributor.author | S.-M. | - |
| dc.date.available | 2021-03-17T09:41:53Z | - |
| dc.date.created | 2021-02-26 | - |
| dc.date.issued | 2017 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/13267 | - |
| dc.title | Editorial | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Cha, Hoyoung | - |
| dc.identifier.scopusid | 2-s2.0-85018776225 | - |
| dc.identifier.bibliographicCitation | Journal of Semiconductor Technology and Science, v.17, no.2, pp.i - iii | - |
| dc.relation.isPartOf | Journal of Semiconductor Technology and Science | - |
| dc.citation.title | Journal of Semiconductor Technology and Science | - |
| dc.citation.volume | 17 | - |
| dc.citation.number | 2 | - |
| dc.citation.startPage | i | - |
| dc.citation.endPage | iii | - |
| dc.type.rims | ART | - |
| dc.type.docType | Editorial | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scopus | - |
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Related Researcher
- Cha, Ho Young
- Engineering (Electronic & Electrical Engineering)