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Radiation hardness evaluation of GaN-based transistors by particle-beam irradiation
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Keum, Dongmin | - |
| dc.contributor.author | D. | - |
| dc.contributor.author | Kim, Hyungtak | - |
| dc.contributor.author | H. | - |
| dc.date.available | 2021-03-17T09:42:23Z | - |
| dc.date.created | 2021-02-26 | - |
| dc.date.issued | 2017 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/13291 | - |
| dc.title | Radiation hardness evaluation of GaN-based transistors by particle-beam irradiation | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Kim, Hyungtak | - |
| dc.identifier.doi | 10.5370/KIEE.2017.66.9.1351 | - |
| dc.identifier.scopusid | 2-s2.0-85030528436 | - |
| dc.identifier.bibliographicCitation | Transactions of the Korean Institute of Electrical Engineers, v.66, no.9, pp.1351 - 1358 | - |
| dc.relation.isPartOf | Transactions of the Korean Institute of Electrical Engineers | - |
| dc.citation.title | Transactions of the Korean Institute of Electrical Engineers | - |
| dc.citation.volume | 66 | - |
| dc.citation.number | 9 | - |
| dc.citation.startPage | 1351 | - |
| dc.citation.endPage | 1358 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Article | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scopus | - |
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Related Researcher
- Kim, Hyung tak
- Engineering (Electronic & Electrical Engineering)