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Examination of microwave forward reflection from a randomly rough lossy dielectric surface
- Authors
- Park, S.; Kweon, S.-K.; Oh, Y.
- Issue Date
- 2014
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- correlation length; Forward reflection; randomly rough surface; reflection coefficient; reflection model; RMS height
- Citation
- International Geoscience and Remote Sensing Symposium (IGARSS), pp.332 - 334
- Journal Title
- International Geoscience and Remote Sensing Symposium (IGARSS)
- Start Page
- 332
- End Page
- 334
- ISSN
- 0000-0000
- Abstract
- We examined the forward reflection from a randomly rough lossy dielectric surface and the accuracy of the forward reflection model. The moment method could be used to compute the forward reflection coefficient. We also examined the effect of correlation length on various correlation length and RSM height. The forward reflection coefficient of a randomly rough surface is computed by the (1) or (2), but the exponential term in (1) goes to zero for a large value of khrms. On the other hand, (2) is stable for a large value of khrms. But (1) and (2) are function of only the RMS height. We will show the effect of correlation length from reflection coefficient. We will also show the modify reflection model with correlation factor for forward reflection from a rough lossy dielectric surface. © 2014 IEEE.
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