Measuring size dependent electrical properties from nanoneedle structures: Pt/ZnO Schottky diodes
- Authors
- Mao, Shimin; Shang, Tao; Park, Byoungnam; Anderson, Daniel D.; Dillon, Shen J.
- Issue Date
- 14-Apr-2014
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.104, no.15
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 104
- Number
- 15
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/16715
- DOI
- 10.1063/1.4871509
- ISSN
- 0003-6951
- Abstract
- This work reports the fabrication and testing of nanoneedle devices with well-defined interfaces that are amenable to a variety of structural and electrical characterization, including transmission electron microscopy. Single Pt/ZnO nanoneedle Schottky diodes were fabricated by a top down method using a combination of electro-polishing, sputtering, and focused ion beam milling. The resulting structures contained nanoscale planar heterojunctions with low ideality factors, the dimensions of which were tuned to study size-dependent electrical properties. The diameter dependence of the Pt/ZnO diode barrier height is explained by a joule heating effect and/or electronic inhomogeneity in the Pt/ZnO contact area. (C) 2014 AIP Publishing LLC.
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Collections - College of Engineering > Materials Science and Engineering Major > 1. Journal Articles
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