Thermoelectric transport properties of S-doped In0.9Si0.1SeThermoelectric transport properties of S-doped In0.9Si0.1Se
- Other Titles
- Thermoelectric transport properties of S-doped In0.9Si0.1Se
- Authors
- Kim, Dong Ho; Kim, Hyun-Sik; Rahman, Jamil Ur; Shin, Weon Ho; Kim, TaeWan; Kim, Sang-il
- Issue Date
- 1-Jan-2022
- Publisher
- SPRINGER HEIDELBERG
- Keywords
- Thermoelectric; Metal chalcogenides; Anion doping
- Citation
- JOURNAL OF THE KOREAN CERAMIC SOCIETY, v.59, no.1, pp.64 - 69
- Journal Title
- JOURNAL OF THE KOREAN CERAMIC SOCIETY
- Volume
- 59
- Number
- 1
- Start Page
- 64
- End Page
- 69
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/18180
- DOI
- 10.1007/s43207-021-00153-1
- ISSN
- 1229-7801
- Abstract
- Layered metal chalcogenides with highly promising thermoelectric properties have attracted attention owing to their intrinsically low thermal conductivity, which originates from their unique layered structure and van der Waals bonding. InSe, a post-transition metal chalcogenide, also has layered atomic structure and low thermal conductivity. We investigate the effects of S doping of Si-doped InSe, In0.9Si0.1Se. The S-doped In0.9Si0.1Se exhibits enhanced thermoelectric properties, with a higher power factor and lower thermal conductivity compared to Si-doped InSe. A significant increase in carrier mobility has an overall positive effect on the electronic transport properties, resulting in a systematic increase in power factor from 0.05 to 0.15 mW/mK(2) with S doping. In addition, the thermal conductivity systematically decreases with S doping owing to additional point-defect scattering. Because of the higher power factor and lower thermal conductivity, the thermoelectric figure of merit of the In0.9Si0.1Se0.9S0.1 sample at 735 K was 0.18, which is 3.6 times that of In0.9Si0.1Se.
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Collections - Graduate School > Materials Science and Engineering > 1. Journal Articles
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