Development of a Scattering Model for Soybean Fields and Verification with Scatterometer and SAR Data at X-BandDevelopment of a Scattering Model for Soybean Fields and Verification with Scatterometer and SAR Data at X-Band
- Other Titles
- Development of a Scattering Model for Soybean Fields and Verification with Scatterometer and SAR Data at X-Band
- Authors
- 권순구; 황지환; 오이석
- Issue Date
- 2012
- Publisher
- 한국전자파학회
- Keywords
- Vegetation Canopy; Backscattering Coefficients; Radiative Transfer Model; Soybean Field; Sar.
- Citation
- Journal of Electromagnetic Engineering and Science, v.12, no.1, pp.115 - 121
- Journal Title
- Journal of Electromagnetic Engineering and Science
- Volume
- 12
- Number
- 1
- Start Page
- 115
- End Page
- 121
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/19657
- DOI
- 10.5515/JKIEES.2012.12.1.115
- ISSN
- 2234-8409
- Abstract
- This paper presents a scattering model and measurements of backscattering coefficients for soybean fields. The polarimetric radar backscatters of a soybean field were measured using the ground-based X-band polarimetric scatterometer in an angular range from 20° to 60°. The backscattering coefficients were also obtained using the COSMO- SkyMed (Spotlight mode, HH-polarization) from July to October 2010. The backscattering coefficients of the soybean field were computed using the 1st-order radiative transfer model (RTM) with field-measured input parameters. The soybean layer is composed of the stems, branches, leaves, and soybean pods. The stems, branches, and pods are modeled with lossy dielectric cylinders, the leaves are modeled with lossy dielectric disks. The estimated backscattering coefficients agree quite well with the field-measured radar backscattering coefficients.
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Collections - College of Engineering > School of Electronic & Electrical Engineering > 1. Journal Articles
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