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Relationship between exo-electron currents from MgO thin film and statistical delay time in ACPDPs
- Authors
- Kuang, Yawei; Yoon, Sang-Hoon; Kim, Yong-Seog
- Issue Date
- Aug-2011
- Publisher
- WILEY
- Keywords
- PDP; MgO; Exo-electron; statistical delay time
- Citation
- JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.19, no.8, pp.568 - 573
- Journal Title
- JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY
- Volume
- 19
- Number
- 8
- Start Page
- 568
- End Page
- 573
- ISSN
- 1071-0922
- Abstract
- The exo-electron currents from a ACPDP test panel with or without MgO crystals sprayed on MgO film were measured directly after eliminating of the wall-voltage effect. An inverse relationship was established between the statistical delay time and exo-electron current from the MgO cathode film. The spraying of MgO crystals on MgO thin film was observed to reduce the statistical delay time dramatically even for the same exo-electron currents measured. The shift of the inverse curve may be attributed to an increased discharge success probability by the MgO crystals sprayed.
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