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A novel gate driving scheme for high power PWM and bypass switches

Authors
Lee, Dong-MyungKeister, Thomas L.Seo, Jae-HyeongHabetler, Thomas G.Harley, Ronald G.Rostron, Joseph R.
Issue Date
25-May-2010
Publisher
IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
Keywords
gate driver; power supply; PWM
Citation
IEICE ELECTRONICS EXPRESS, v.7, no.10, pp.704 - 710
Journal Title
IEICE ELECTRONICS EXPRESS
Volume
7
Number
10
Start Page
704
End Page
710
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/20787
DOI
10.1587/elex.7.704
ISSN
1349-2543
Abstract
This paper proposes a new driving scheme for insulated gate bipolar junction transistors (IGBTs) and thyristors used for high power conversion. Most power conversion techniques are based on switching actions so that gate driving scheme and their related circuits have important roles in power conversion. In this paper, fault-tolerant gate driving schemes for power switches and their power supply that utilizes stored energy in the system are presented. Experiments have been carried out with 6500V-rated IGBTs and thyristors to verify the validity of the proposed driving scheme.
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