Parameters influencing exo-electron emission currents from MgO film of ACPDPs
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoon, Sang-Hoon | - |
dc.contributor.author | Yang, Heesun | - |
dc.contributor.author | Kim, Yong-Seog | - |
dc.date.accessioned | 2021-12-17T01:44:18Z | - |
dc.date.available | 2021-12-17T01:44:18Z | - |
dc.date.created | 2021-12-16 | - |
dc.date.issued | 2010-02 | - |
dc.identifier.issn | 1071-0922 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/20846 | - |
dc.description.abstract | A theoretical model of exo-electron emission kinetics was developed by considering back-diffusion and the gas-amplification phenomena. Using the model, the effects of temperature, trapped electron concentration, trap energy level, and trap concentration on the exo-electron currents were predicted and compared with experimental results. The theoretically predicted values agreed reasonably well with the trends of the measured results. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | SOC INFORMATION DISPLAY | - |
dc.subject | THIN-FILM | - |
dc.subject | AC-PDP | - |
dc.subject | COEFFICIENT | - |
dc.subject | DISCHARGE | - |
dc.subject | AFFINITY | - |
dc.subject | DELAY | - |
dc.title | Parameters influencing exo-electron emission currents from MgO film of ACPDPs | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Yang, Heesun | - |
dc.contributor.affiliatedAuthor | Kim, Yong-Seog | - |
dc.identifier.doi | 10.1889/JSID18.2.164 | - |
dc.identifier.scopusid | 2-s2.0-76649129042 | - |
dc.identifier.wosid | 000274154400009 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.18, no.2, pp.164 - 172 | - |
dc.relation.isPartOf | JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | - |
dc.citation.title | JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | - |
dc.citation.volume | 18 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 164 | - |
dc.citation.endPage | 172 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | THIN-FILM | - |
dc.subject.keywordPlus | AC-PDP | - |
dc.subject.keywordPlus | COEFFICIENT | - |
dc.subject.keywordPlus | DISCHARGE | - |
dc.subject.keywordPlus | AFFINITY | - |
dc.subject.keywordPlus | DELAY | - |
dc.subject.keywordAuthor | PDP | - |
dc.subject.keywordAuthor | exo-electron | - |
dc.subject.keywordAuthor | statistical delay | - |
dc.subject.keywordAuthor | wall charge | - |
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