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Characterization of Stiffness Constants of Silicon versus Temperature Using “Poisson’s ratio Measurements
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조준형 | - |
| dc.date.accessioned | 2021-12-24T01:40:09Z | - |
| dc.date.available | 2021-12-24T01:40:09Z | - |
| dc.date.created | 2021-12-24 | - |
| dc.date.issued | 2015-07 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/21737 | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | IEEK, IEICE | - |
| dc.title | Characterization of Stiffness Constants of Silicon versus Temperature Using “Poisson’s ratio Measurements | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | 조준형 | - |
| dc.identifier.bibliographicCitation | Proceedings of 2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, v.1, no.1, pp.346 - 351 | - |
| dc.relation.isPartOf | Proceedings of 2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices | - |
| dc.citation.title | Proceedings of 2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices | - |
| dc.citation.volume | 1 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 346 | - |
| dc.citation.endPage | 351 | - |
| dc.type.rims | ART | - |
| dc.description.journalClass | 3 | - |
| dc.description.isOpenAccess | N | - |
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Related Researcher
- Cho, Chun Hyung
- Science & Technology (Department of Electronic & Electrical Convergence Engineering)