Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Polarimetric Backscattering Coefficients of Flooded Rice Fields at L- and C-Bands: Measurements, Modeling, and Data Analysis

Authors
Oh, YisokHong, Suk-YoungKim, YunjinHong, Jin-YoungKim, Yi-Hyun
Issue Date
Aug-2009
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Flooded rice field; polarimetric backscattering coefficients; radiative transfer method; scatterometer measurements
Citation
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, v.47, no.8, pp.2714 - 2721
Journal Title
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
Volume
47
Number
8
Start Page
2714
End Page
2721
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/21823
DOI
10.1109/TGRS.2009.2014053
ISSN
0196-2892
Abstract
The polarimetric backscattering coefficients (vv-, hh-, hv-, and vh-polarizations) of a flooded rice field are measured using L-and C-band ground-based polarimetric scatterometers. These measurements were made during the rice growth cycle, i.e., from the transplanting period to the harvest period (May to October 2006), to understand the feasibility of modeling and estimating rice growth. We also collected ground truth data that include fresh and dry biomasses, plant height, leaf area index, and leaf size. To study the incidence angle effect, the scatterometer data were collected at four different incidence angles, i.e., 30 degrees, 40 degrees, 50 degrees, and 60 degrees. In this paper, we show that the backscattering coefficients of a rice field can accurately be modeled using the radiative transfer theory. We also demonstrate that a polarimetric scatterometer is an effective tool for estimating rice growth. The hh-polarized backscattering coefficient is more sensitive to rice growth than its vv-polarization counterpart. The polarimetric ratio can be used to estimate rice growth accurately.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electronic & Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE