OLED 디스플레이 제작을 위한 Joule 유도 결정화 공정에서의 유리기판에 대한 열해석Thermal Analysis on Glass Backplane of OLED Displays During Joule Induced Crystallization Process
- Other Titles
- Thermal Analysis on Glass Backplane of OLED Displays During Joule Induced Crystallization Process
- Authors
- 김동현; 박승호; 정장균; 노재상; 이성혁; 홍원의
- Issue Date
- 2009
- Publisher
- 대한기계학회
- Keywords
- Joule Heating (줄 가열); Silicon Crystallization (실리콘 결정화); Glass Deformation(유
리 변형); OLED Display Backplane (OLED 디스플레이 기판)
- Citation
- 대한기계학회논문집 B, v.33, no.10, pp.797 - 802
- Journal Title
- 대한기계학회논문집 B
- Volume
- 33
- Number
- 10
- Start Page
- 797
- End Page
- 802
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/22118
- ISSN
- 1226-4881
- Abstract
- Large area crystallization of amorphous silicon thin-films on glass substrates is one of key technologies in
manufacturing flat displays. Among various crystallization technologies, the Joule induced crystallization
(JIC) is considered as the highly promising one in the OLED fabrication industries, since the amorphous
silicon films on the glass can be crystallized within tens of microseconds, minimizing the thermally and
structurally harmful influence on the glass. In the JIC process the metallic layers can be utilized to heat up the
amorphous silicon thin films beyond the melting temperatures of silicon and can be fabricated as electrodes in
OLED devices during the subsequent processes. This numerical study investigates the heating mechanisms
during the JIC process and estimates the deformation of the glass substrate. Based on the thermal analysis, we
can understand the temporal and spatial temperature fields of the backplane and its warping phenomena.
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Collections - College of Engineering > Materials Science and Engineering Major > 1. Journal Articles
- College of Engineering > Department of Mechanical and System Design Engineering > 1. Journal Articles
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