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Late-news paper: Measurement of exo-electron emission from MgO thin film of AC-PDP
- Authors
- Yoon, S.-H.; Ryu, H.-W.; Hong, C.-R.; Kim, D.-H.; Ko, J.-J.; Kim, Y.-S.
- Issue Date
- 2008
- Publisher
- Society for Information Display
- Citation
- Digest of Technical Papers - SID International Symposium, v.39, no.1, pp.287 - 290
- Volume
- 39
- Number
- 1
- Start Page
- 287
- End Page
- 290
- ISSN
- 0097-966X
- Abstract
- Exoelectron emission from MgO thin film was measured by attaching a high precision current sensor to the address electrode of rear plate of test panels ofAC-PDP. The measured results revealed that the exoelectron emission currents vary very sensitively with the type of doping elements used and measuring temperatures. The activation energy of the exo-electron emissions estimated from the emission curves indicated that the trap levels lies between 0.05-0.32eV below the bottom of its conduction band. This suggests that shallow electron trap levels within MgO film are mainly responsible for the exo-electron emissions, rather than deep trap levels like F-type centers. © 2008 SID.
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