Investigation of external feedback effects on relative intensity noise characteristics of 405 nm InAlGaN laser diodes
- Authors
- Yi, J.C.; Kim, J.-Y.
- Issue Date
- 2006
- Publisher
- SPIE-INT SOC OPTICAL ENGINEERING
- Keywords
- External feedback effect; InAlGaN laser diode; Langevin diffusion model; Relative intensity noise; Strained wurtzite crystal
- Citation
- Proceedings of SPIE - The International Society for Optical Engineering, v.6282
- Journal Title
- Proceedings of SPIE - The International Society for Optical Engineering
- Volume
- 6282
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/25058
- DOI
- 10.1117/12.685192
- ISSN
- 0277-786X
- Abstract
- The external feedback effect on the relative intensity noise characteristics of 405 nm InAlGaN laser diode has been analyzed taking into account the spontaneous emission noise and the high frequency modulation of the injection current. A Langevin diffusion model was exploited to characterize its relative intensity noise. The spontaneous emission noise components were quantitatively evaluated from the optical gain properties of the InAlGaN multiple quantum well active regions by using the multiband Hamiltonian for the strained wurtzite crystals. The extracted parameters were applied to the rate equations taking into account the external feedback and external current modulation effects. The simulation results were investigated to optimize the relative intensity noise characteristics.
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Collections - College of Engineering > School of Electronic & Electrical Engineering > 1. Journal Articles
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