Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

The effects of electroplating parameters on the composition and morphology of Sn-Ag solder

Authors
Kim, JYYu, JLee, JHLee, TY
Issue Date
Dec-2004
Publisher
SPRINGER
Keywords
Sn-Ag solder; electroplating; pulse plating; morphology; duty cycle; surface-active agent
Citation
JOURNAL OF ELECTRONIC MATERIALS, v.33, no.12, pp.1459 - 1464
Journal Title
JOURNAL OF ELECTRONIC MATERIALS
Volume
33
Number
12
Start Page
1459
End Page
1464
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/25714
DOI
10.1007/s11664-004-0087-9
ISSN
0361-5235
Abstract
The Sn-Ag solder was electrodeposited from a bath that basically is composed of tin sulfate (SnSO4), silver nitrate (AgNO3), and thiourea (CH4N2S), acting as a complexing agent to silver. The composition and morphology of electrodeposited Sn-Ag solder were studied in terms of silver concentration in bath current density, duty cycle, and additives. It was possible to control silver content in the electrodeposit by means of varying silver concentration in bath and current density. The microstructure and surface morphology of the electrodeposit become finer and smoother with increasing current density. The pulse-current (PC) plating method was applied to compare to the conventional direct-current (DC) plating. Varying duty cycle in PC plating did not change the microstructure in general, but some improvement in surface roughness was observed compared to DC plating. However, the silver composition in the electrodeposit increased with decreasing the duty cycle at a constant current density. An addition of a surface-active agent helped to reduce the surface roughness and the variation of silver content in the electrodeposit. In an optimum condition, eutectic Sn-Ag solder bumps with a fine pitch of 30 mum and height of 15 mum were successfully electroplated. The composition of Sn-Ag bumps was analyzed by energy dispersive x-ray spectrometry (EDS) and wavelength dispersive x-ray spectrometry (WDS) methods, and the surface morphology was characterized by scanning electron microscopy (SEM) and a three-dimensional surface analyzer.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Materials Science and Engineering Major > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Jae Ho photo

Lee, Jae Ho
Engineering (Advanced Materials)
Read more

Altmetrics

Total Views & Downloads

BROWSE