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Shear strength and aging characteristics of 63Sn-37Pb solder bumps with various solder ball and pad sizes

Authors
Choi, JWCha, HSOh, TS
Issue Date
Jun-2003
Publisher
KOREAN INST METALS MATERIALS
Keywords
solder; Sn-Pb; shear strength; aging; electronic packaging
Citation
METALS AND MATERIALS INTERNATIONAL, v.9, no.3, pp.273 - 278
Journal Title
METALS AND MATERIALS INTERNATIONAL
Volume
9
Number
3
Start Page
273
End Page
278
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/25963
DOI
10.1007/BF03027046
ISSN
1598-9623
Abstract
The shear strength and aging characteristics of 63Sn-37Pb solder bumps were characterized with variation in solder ball and UBM pad sizes. The shear strength increased with shorter effective crack size, a(eff), which was determined with the solder ball and pad sizes. The shear strength of the solder bumps on Au/Ni/Cu and Ni/Cu did not change significantly with reflow time. Substantial decrease in the shear strength occurred for the solder bumps formed on Au/Ni/Cu with aging treatment, and the shear strength after aging was also related to the bump shape which was determined with the solder ball and pad sizes.
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