Electrical properties of the Pt/Sr0.85Bi2.4Ta2O9/TiO2/Si structure with variation of the Sr0.85Bi2.4Ta2O9 film thickness

Kim, JW; Park, JD; Choi, JH; Oh, TS

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Electrical properties of the Pt/Sr0.85Bi2.4Ta2O9/TiO2/Si structure with variation of the Sr0.85Bi2.4Ta2O9 film thickness

Authors: Kim, JW; Park, JD; Choi, JH; Oh, TS

Issue Date: 1-Apr-2003

Publisher: SPRINGER

Citation: JOURNAL OF MATERIALS SCIENCE LETTERS, v.22, no.7, pp.535 - 537

Journal Title: JOURNAL OF MATERIALS SCIENCE LETTERS

Volume: 22

Number: 7

Start Page: 535

End Page: 537

URI: https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/25987

DOI: 10.1023/A:1022994521453

ISSN: 0261-8028

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Appears in Collections: College of Engineering > Materials Science and Engineering Major > 1. Journal Articles

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