Full-wave analysis of microwave scattering from short vegetation: An investigation on the effect of multiple scattering
- Authors
- Oh, Y; Jang, YM; Sarabandi, K
- Issue Date
- Nov-2002
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- impedance surface; method of moments (MoM); multiple scattering; three-dimensional lossy dielectric structures
- Citation
- IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, v.40, no.11, pp.2522 - 2526
- Journal Title
- IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
- Volume
- 40
- Number
- 11
- Start Page
- 2522
- End Page
- 2526
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/26791
- DOI
- 10.1109/TGRS.2002.805085
- ISSN
- 0196-2892
- Abstract
- A full-wave solution for polarimetric scattering from a cluster of randomly oriented three-dimensional lossy dielectric structures above an impedance surface is presented to investigate the importance of multiple scattering. The problem is formulated using an integral equation in conjunction with the exact image representation of dyadic Green's function for the half-space problem. Then, the integral equation is solved for the induced equivalent polarization currents using the method of moments. The accuracy of the numerical code is verified using other existing numerical results and experimental observations. The model is then used to examine the effect of multiple scattering among a cluster of relatively short stems and is shown that multiple scattering significantly affects the cross-polarized backscatter whereas it has a moderate effect on the copolarized backscattering depending on the stem density.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > School of Electronic & Electrical Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.