Ferroelectric characteristics of liquid source misted chemical deposition (LSMCD)-derived SrBi2.4Ta2O9 thin films with thickness variation
DC Field | Value | Language |
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dc.contributor.author | Park, JD | - |
dc.contributor.author | Oh, TS | - |
dc.contributor.author | Lee, JH | - |
dc.contributor.author | Park, JY | - |
dc.date.accessioned | 2022-04-14T05:40:41Z | - |
dc.date.available | 2022-04-14T05:40:41Z | - |
dc.date.created | 2022-04-14 | - |
dc.date.issued | 2000-12-08 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/27322 | - |
dc.description.abstract | SrBi2.4Ta2O9 (SBT) thin films of 70-400 nm thickness were prepared on platinized Si substrates by liquid-source misted chemical deposition (LSMCD), and the thickness dependence of the ferroelectric characteristics was investigated. The grain size of the LSMCD-derived SET films was approximately 150 nm and hardly varied with the film thickness. The 70-nm thick SET film exhibited remanent polarization (2P(r)) of 13.5 muC/cm(2) and a coercive field value (E-c) of 63 kV/cm at +/-3 V. Within the thickness range of 70-400 nm, the LSMCD-derived SET films exhibited size effects, i.e. a decrease in remanent polarization and relative permittivity and an increase in the coercive held with a reduction in the film thickness. The LSMCD-derived SET films with a thickness of 70-400 nm exhibited fatigue-free behavior for up to 10(12) switching cycles. (C) 2000 Elsevier Science B.V. All rights reserved. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.title | Ferroelectric characteristics of liquid source misted chemical deposition (LSMCD)-derived SrBi2.4Ta2O9 thin films with thickness variation | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Oh, TS | - |
dc.contributor.affiliatedAuthor | Lee, JH | - |
dc.identifier.doi | 10.1016/S0040-6090(00)01549-2 | - |
dc.identifier.wosid | 000166264900028 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.379, no.1-2, pp.183 - 187 | - |
dc.relation.isPartOf | THIN SOLID FILMS | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 379 | - |
dc.citation.number | 1-2 | - |
dc.citation.startPage | 183 | - |
dc.citation.endPage | 187 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordAuthor | deposition process | - |
dc.subject.keywordAuthor | ferroelectric properties | - |
dc.subject.keywordAuthor | SrBi2.4Ta2O9 (SBT) | - |
dc.subject.keywordAuthor | size effects | - |
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