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Effects of Sensor Platform Scaling on Signal-to-Noise Ratio in the Resistor-and Horizontal Floating-Gate FET-Type Gas Sensors

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dc.contributor.authorShin, Wonjun-
dc.contributor.authorKoo, Ryun-Han-
dc.contributor.authorHong, Seongbin-
dc.contributor.authorJung, Gyuweon-
dc.contributor.authorJeong, Yujeong-
dc.contributor.authorLee, Sung-Tae-
dc.contributor.authorLee, Jong-Ho-
dc.date.accessioned2024-01-03T05:30:34Z-
dc.date.available2024-01-03T05:30:34Z-
dc.date.issued2023-11-
dc.identifier.issn0018-9383-
dc.identifier.issn1557-9646-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/32398-
dc.description.abstractWe investigate the effects of sensor platform scaling on signal-to-noise-ratio (SNR) in the resistor-and field-effect-transistor (FET)-type gas sensors with horizontal floating gate (FG). Indium–gallium–zinc oxide (IGZO) is used as a sensing material and deposited by the RF sputtering method. The low-frequency noise (LFN) characteristics of the resistor-and FET-type gas sensors are determined by the sensing material and FET transducer, respectively. In both resistor-and FET-type gas sensors, the SNR decreases with the scaling of the sensing area. However, the reason for a decrease in the SNR differs depending on the sensor platform. The decrease in SNR in a resistor-type gas sensor is due to an increase in intrinsic device noise and gas-to-air-noise ratio (GANR), whereas a decrease in SNR in an FET-type gas sensor is due to a decrease in response. The results provide important design guidelines in designing and fabricating the resistor-and FET-type gas sensors. IEEE-
dc.format.extent6-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleEffects of Sensor Platform Scaling on Signal-to-Noise Ratio in the Resistor-and Horizontal Floating-Gate FET-Type Gas Sensors-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/TED.2023.3312060-
dc.identifier.scopusid2-s2.0-85171549264-
dc.identifier.wosid001071979600001-
dc.identifier.bibliographicCitationIEEE Transactions on Electron Devices, v.70, no.11, pp 1 - 6-
dc.citation.titleIEEE Transactions on Electron Devices-
dc.citation.volume70-
dc.citation.number11-
dc.citation.startPage1-
dc.citation.endPage6-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordAuthorIndium–gallium–zinc oxide (IGZO)-
dc.subject.keywordAuthorlow-frequency noise (LFN)-
dc.subject.keywordAuthornitrogen dioxide (NO<inline-formula xmlns:ali=http://www.niso.org/schemas/ali/1.0/ xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink xmlns:xsi=http://www.w3.org/2001/XMLSchema-instance> <tex-math notation=LaTeX>$_{\text{2}}$</tex-math> </inline-formula>)-
dc.subject.keywordAuthorscaling-
dc.subject.keywordAuthorsignal-to-noise ratio (SNR)-
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