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Bias Instability of Indium-Doped Zinc-Oxide Thin-Film Transistor
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 최종선 | - |
| dc.date.available | 2020-07-10T04:19:23Z | - |
| dc.date.created | 2020-07-08 | - |
| dc.date.issued | 2018-08-31 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/3286 | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | The Korean Information Display Society | - |
| dc.title | Bias Instability of Indium-Doped Zinc-Oxide Thin-Film Transistor | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | 최종선 | - |
| dc.identifier.bibliographicCitation | IMID 2018 Digest, v.1, no.1, pp.202 - 202 | - |
| dc.relation.isPartOf | IMID 2018 Digest | - |
| dc.citation.title | IMID 2018 Digest | - |
| dc.citation.volume | 1 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 202 | - |
| dc.citation.endPage | 202 | - |
| dc.type.rims | ART | - |
| dc.description.journalClass | 1 | - |
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