Bias Instability of Indium-Doped Zinc-Oxide Thin-Film Transistor

최종선

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Bias Instability of Indium-Doped Zinc-Oxide Thin-Film Transistor

Authors: 최종선

Issue Date: 31-Aug-2018

Publisher: The Korean Information Display Society

Citation: IMID 2018 Digest, v.1, no.1, pp.202 - 202

Journal Title: IMID 2018 Digest

Volume: 1

Number: 1

Start Page: 202

End Page: 202

URI: https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/3286

Files in This Item: There are no files associated with this item.

Appears in Collections: College of Engineering > School of Electronic & Electrical Engineering > 1. Journal Articles

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