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Band Alignment Transition and Enhanced Performance in Vertical SnS<sub>2</sub>/MoS<sub>2</sub> van der Waals Photodetectors

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dc.contributor.authorShi, Mingyu-
dc.contributor.authorLv, Yanhui-
dc.contributor.authorWu, Gang-
dc.contributor.authorCho, Jiung-
dc.contributor.authorAbid, Mohamed-
dc.contributor.authorHung, Kuan-Ming-
dc.contributor.authorCoileain, Cormac O.-
dc.contributor.authorChang, Ching-Ray-
dc.contributor.authorWu, Han-Chun-
dc.date.accessioned2024-05-30T08:31:21Z-
dc.date.available2024-05-30T08:31:21Z-
dc.date.issued2024-04-16-
dc.identifier.issn1944-8244-
dc.identifier.issn1944-8252-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/33171-
dc.description.abstractThe strong light-matter interaction and naturally passivated surfaces of van der Waals materials make heterojunctions of such materials ideal candidates for high-performance photodetectors. In this study, we fabricated SnS2/MoS2 van der Waals heterojunctions and investigated their photoelectric properties. Using an applied gate voltage, we can effectively alter the band arrangement and achieve a transition in type II and type I junctions. It is found that the SnS2/MoS2 van der Waals heterostructures are type II heterojunctions when the gate voltage is above -25 V. Below this gate voltage, the heterojunctions become type I. Photoelectric measurements under various wavelengths of incident light reveal enhanced sensitivity in the ultraviolet region and a broadband sensing range from 400 to 800 nm. Moreover, due to the transition from type II to type I band alignment, the measured photocurrent saturates at a specific gate voltage, and this value depends crucially on the bias voltage and light wavelength, providing a potential avenue for designing compact spectrometers.-
dc.format.extent10-
dc.language영어-
dc.language.isoENG-
dc.publisherAMER CHEMICAL SOC-
dc.titleBand Alignment Transition and Enhanced Performance in Vertical SnS&lt;sub&gt;2&lt;/sub&gt;/MoS&lt;sub&gt;2&lt;/sub&gt; van der Waals Photodetectors-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1021/acsami.4c00781-
dc.identifier.scopusid2-s2.0-85190733262-
dc.identifier.wosid001203613100001-
dc.identifier.bibliographicCitationACS APPLIED MATERIALS &amp; INTERFACES, v.16, no.17, pp 22622 - 22631-
dc.citation.titleACS APPLIED MATERIALS &amp; INTERFACES-
dc.citation.volume16-
dc.citation.number17-
dc.citation.startPage22622-
dc.citation.endPage22631-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience &amp; Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryNanoscience &amp; Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusBROAD-BAND-
dc.subject.keywordPlusGRAPHENE-
dc.subject.keywordPlusHETEROSTRUCTURE-
dc.subject.keywordPlusMONOLAYER-
dc.subject.keywordPlusMOS2-
dc.subject.keywordPlusPROGRESS-
dc.subject.keywordAuthorSnS2/MoS2-
dc.subject.keywordAuthorband alignment-
dc.subject.keywordAuthorbroadband photodetector-
dc.subject.keywordAuthorvan der Waals heterojunction-
dc.subject.keywordAuthorphotoluminescence quenching-
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