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Sample Preparation for Microstructural Characterization of Ni-Yttria-Stabilized Zirconia Anodes
- Authors
- Sim, Soo-Man
- Issue Date
- Jul-2018
- Publisher
- KOREAN CERAMIC SOC
- Keywords
- NiO-YSZ; Ni-YSZ; Microstructure; Polishing; Electrolytic Etching
- Citation
- JOURNAL OF THE KOREAN CERAMIC SOCIETY, v.55, no.4, pp.376 - 380
- Journal Title
- JOURNAL OF THE KOREAN CERAMIC SOCIETY
- Volume
- 55
- Number
- 4
- Start Page
- 376
- End Page
- 380
- ISSN
- 1229-7801
- Abstract
- Microstructural characterization of Ni-yttria-stabilized zirconia (YSZ) anodes using secondary electron images has been limited by a lack of contrast between Ni and YSZ phases. This paper reports a sample preparation method for obtaining secondary electron images that allow the detection of Ni, YSZ, and pore phases together. Ni-YSZ anode samples were obtained by reducing NiO-YSZ samples prepared by using the mixed oxide method. Colloidal silica polishing and electrolytic etching were performed on the Ni-YSZ samples. The morphological change of the sample surface after each polishing process is examined.
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