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Ka-Band MMIC Using AlGaN/GaN-on-Si With Recessed High-k Dual MIS Structure

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dc.contributor.authorKim, Dong-Hwan-
dc.contributor.authorPark, Hongjong-
dc.contributor.authorEom, Su-Keun-
dc.contributor.authorJeong, Jun-Seok-
dc.contributor.authorCha, Ho-Young-
dc.contributor.authorSeo, Kwang-Seok-
dc.date.available2020-07-10T04:22:34Z-
dc.date.created2020-07-06-
dc.date.issued2018-07-
dc.identifier.issn0741-3106-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/3475-
dc.description.abstractThis letter reports the excellent radio frequency output characteristics of AlGaN/GaN-on-Si power amplifier (PA) monolithic microwave integrated circuits (MMICs) operating at the Ka-band, employing a recessed metal-insulator-semiconductor (MIS) structure with SiNx/HfON dual dielectric layers. The fabricated 0.15-mu m AlGaN/GaN-on-Si high electron-mobility transistor (HEMT) exhibited a low OFF-state current and reduced current collapse in comparison with the conventional Schottky gate HEMT; therefore, an enhanced output power of the PA MMIC is achieved. The fabricated two-stage PA MMIC exhibited a continuous-wave output power of >29 dBm with a power-added efficiency (PAE) of 14.5% at the drain voltage of 20 V, at 26.5 GHz.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectPOWER-AMPLIFIER-
dc.subjectHEMTS-
dc.subjectTRANSISTORS-
dc.subjectVOLTAGE-
dc.subjectDEVICES-
dc.subjectSILICON-
dc.subjectLEAKAGE-
dc.titleKa-Band MMIC Using AlGaN/GaN-on-Si With Recessed High-k Dual MIS Structure-
dc.typeArticle-
dc.contributor.affiliatedAuthorCha, Ho-Young-
dc.identifier.doi10.1109/LED.2018.2834223-
dc.identifier.scopusid2-s2.0-85046412054-
dc.identifier.wosid000437087400018-
dc.identifier.bibliographicCitationIEEE ELECTRON DEVICE LETTERS, v.39, no.7, pp.995 - 998-
dc.relation.isPartOfIEEE ELECTRON DEVICE LETTERS-
dc.citation.titleIEEE ELECTRON DEVICE LETTERS-
dc.citation.volume39-
dc.citation.number7-
dc.citation.startPage995-
dc.citation.endPage998-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusPOWER-AMPLIFIER-
dc.subject.keywordPlusHEMTS-
dc.subject.keywordPlusTRANSISTORS-
dc.subject.keywordPlusVOLTAGE-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusLEAKAGE-
dc.subject.keywordAuthorAlGaN/GaN-on-Si-
dc.subject.keywordAuthorgate recess-
dc.subject.keywordAuthordual MIS-
dc.subject.keywordAuthorhigh-k-
dc.subject.keywordAuthorMMIC-
dc.subject.keywordAuthorpower amplifier-
dc.subject.keywordAuthorKa-band-
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