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Results 1-3 of 3 (Search time: 0.008 seconds).
Characteristics of Pt/SBT/ZrO2/Si structure for metal ferroelectric insulator semiconductor field effect transistor applications
Park, JD; Oh, TS
Article
Issue Date
2001
Citation
INTEGRATED FERROELECTRICS, v.34, no.1-4, pp.1561 - 1570
Publisher
TAYLOR & FRANCIS LTD
Characteristics of the MFIS structure fabricated with the lsmcd-derived SBT thin film and TiO2 buffer layer
Park, JD; Kim, JW; Oh, TS
Article
Issue Date
2001
Citation
FERROELECTRICS, v.260, no.1-4, pp.629 - 634
Publisher
TAYLOR & FRANCIS LTD
Ferroelectric characteristics of the LSMCD-derived SrBi2.4Ta2O9 thin films
Park, JD; Kim, JW; Oh, TS
Article
Issue Date
2001
Citation
FERROELECTRICS, v.260, no.1-4, pp.635 - 640
Publisher
TAYLOR & FRANCIS LTD
1
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Author
Oh, TAE SUNG
3
Subject
thin film
3
ferroelectrics
2
MFIS-FET
2
SBT
2
ferroelectric properties
1
LAYERS
1
SET
1
size effects
1
THIN-FILMS
1
TiO2
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Ferroelectrics
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Integrated Ferroelectrics
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