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Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights
- Authors
- 조형민
- Issue Date
- 8-Nov-2017
- Publisher
- IEEE
- Citation
- IEEE International Conference on Computer Design , v.1, no.1, pp.593 - 596
- Journal Title
- IEEE International Conference on Computer Design
- Volume
- 1
- Number
- 1
- Start Page
- 593
- End Page
- 596
- ISSN
- 1063-6404
- Files in This Item
- There are no files associated with this item.
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Collections - College of Engineering > Computer Engineering Major > 1. Journal Articles
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