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Network topology and resilience analysis of South Korean power grid

Authors
Kim, Dong HwanEisenberg, Daniel A.Chun, Yeong HanPark, Jeryang
Issue Date
Jan-2017
Publisher
ELSEVIER
Keywords
Complex network; Scale-free; Vulnerability; Robustness; Critical infrastructure
Citation
PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS, v.465, pp.13 - 24
Journal Title
PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS
Volume
465
Start Page
13
End Page
24
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/6202
DOI
10.1016/j.physa.2016.08.002
ISSN
0378-4371
Abstract
In this work, we present topological and resilience analyses of the South Korean power grid (KPG) with a broad voltage level. While topological analysis of KPG only with high-voltage infrastructure shows an exponential degree distribution, providing another empirical evidence of power grid topology, the inclusion of low voltage components generates a distribution with a larger variance and a smaller average degree. This result suggests that the topology of a power grid may converge to a highly skewed degree distribution if more low-voltage data is considered. Moreover, when compared to ER random and BA scale free networks, the KPG has a lower efficiency and a higher clustering coefficient, implying that highly clustered structure does not necessarily guarantee a functional efficiency of a network. Error and attack tolerance analysis, evaluated with efficiency, indicate that the KPG is more vulnerable to random or degree-based attacks than betweenness-based intentional attack. Cascading failure analysis with recovery mechanism demonstrates that resilience of the network depends on both tolerance capacity and recovery initiation time. Also, when the two factors are fixed, the KPG is most vulnerable among the three networks. Based on our analysis, we propose that the topology of power grids should be designed so the loads are homogeneously distributed, or functional hubs and their neighbors have high tolerance capacity to enhance resilience. (C) 2016 Elsevier B.V. All rights reserved.
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