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Analysis of Thermal Stress Effect on Blue Phosphorescent Organic Light-Emitting Diodes for Device Stability
- Authors
- Lee, Sungkyu; Lee, Ho Won; Na, InYeob; Yoo, Han Kyu; Hwang, Kyo Min; Baek, Hyun Jung; Kim, Gyu-Tae; Kim, Young Kwan
- Issue Date
- Jan-2017
- Publisher
- AMER SCIENTIFIC PUBLISHERS
- Keywords
- Blue Phosphorescent Organic Light-Emitting Diode; Degradation; Thermal Stress; Crystallization; Organic-Organic Interdiffusion
- Citation
- NANOSCIENCE AND NANOTECHNOLOGY LETTERS, v.9, no.1, pp.14 - 19
- Journal Title
- NANOSCIENCE AND NANOTECHNOLOGY LETTERS
- Volume
- 9
- Number
- 1
- Start Page
- 14
- End Page
- 19
- ISSN
- 1941-4900
- Abstract
- We demonstrated the influence of external thermal stress on blue phosphorescent organic lightemitting diodes. We fabricated devices using the same structure and materials, including a low glass transition temperature material, and the devices were then annealed at 50, 60, 70, and 80 degrees C to compare their properties to those of pristine device. In this study, we observed a decrease in the current density-voltage-luminance and lifetime due to thermal stress, and we also used various analysis methods, such as impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the device.
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Related Researcher
- Kim, Young Kwan
- Engineering (Applied Science)