Investigation of kink effect in normally-off AlGaN/GaN recessed-gate MOS-heterostructure FETs
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kang, Youngjin | - |
dc.contributor.author | Sung, Hyuk-kee | - |
dc.contributor.author | Kim, Hyungtak | - |
dc.date.available | 2020-07-10T05:49:53Z | - |
dc.date.created | 2020-07-06 | - |
dc.date.issued | 2016-09 | - |
dc.identifier.issn | 2166-2746 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/7438 | - |
dc.description.abstract | Kink effects, anomalous increase of the output current, were observed at room temperature in normally-off AlGaN/GaN metal-oxide-semiconductor (MOS)-heterostructure field effect transistors with recessed gate. The kink phenomenon occurred only at certain bias-sweeping conditions and is suggested to result from electron trapping and subsequent detrapping process which gave rise to temporary shift of the threshold voltage. The magnitude of the kink is related to the positive gate bias and the temperature. Positive bias applied on the gate induced the negative charge build-up at the MOS interface and hot electrons released trapped electrons by impact ionization. (C) 2016 American Vacuum Society. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | A V S AMER INST PHYSICS | - |
dc.subject | GAN | - |
dc.subject | HEMTS | - |
dc.title | Investigation of kink effect in normally-off AlGaN/GaN recessed-gate MOS-heterostructure FETs | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Sung, Hyuk-kee | - |
dc.contributor.affiliatedAuthor | Kim, Hyungtak | - |
dc.identifier.doi | 10.1116/1.4959842 | - |
dc.identifier.scopusid | 2-s2.0-84979992910 | - |
dc.identifier.wosid | 000385434100025 | - |
dc.identifier.bibliographicCitation | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.34, no.5 | - |
dc.relation.isPartOf | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | - |
dc.citation.title | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | - |
dc.citation.volume | 34 | - |
dc.citation.number | 5 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | GAN | - |
dc.subject.keywordPlus | HEMTS | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
94, Wausan-ro, Mapo-gu, Seoul, 04066, Korea02-320-1314
COPYRIGHT 2020 HONGIK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.