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Characterizing microscale aluminum composite layer properties on silicon solar cells with hybrid 3D scanning force measurements

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dc.contributor.authorBae, Sung-Kuk-
dc.contributor.authorChoi, Beomjoon-
dc.contributor.authorChung, Haseung-
dc.contributor.authorShin, Seungwon-
dc.contributor.authorSong, Hee-eun-
dc.contributor.authorSeo, Jung Hwan-
dc.date.available2020-07-10T06:12:36Z-
dc.date.created2020-07-06-
dc.date.issued2016-03-07-
dc.identifier.issn2045-2322-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/8041-
dc.description.abstractThis article presents a novel technique to estimate the mechanical properties of the aluminum composite layer on silicon solar cells by using a hybrid 3-dimensional laser scanning force measurement (3-D LSFM) system. The 3-D LSFM system measures the material properties of sub-layers constituting a solar cell. This measurement is critical for realizing high-efficient ultra-thin solar cells. The screen-printed aluminum layer, which significantly affects the bowing phenomenon, is separated from the complete solar cell by removing the silicon (Si) layer with deep reactive ion etching. An elastic modulus of similar to 15.1 GPa and a yield strength of similar to 35.0 MPa for the aluminum (Al) composite layer were obtained by the 3-D LSFM system. In experiments performed for 6-inch Si solar cells, the bowing distances decreased from 12.02 to 1.18 mm while the Si layer thicknesses increased from 90 to 190 mu m. These results are in excellent agreement with the theoretical predictions for ultra-thin Si thickness (90 mu m) based on the obtained Al composite layer properties.-
dc.language영어-
dc.language.isoen-
dc.publisherNATURE PUBLISHING GROUP-
dc.subjectCRYSTALLINE SILICON-
dc.subjectBOWING PHENOMENON-
dc.titleCharacterizing microscale aluminum composite layer properties on silicon solar cells with hybrid 3D scanning force measurements-
dc.typeArticle-
dc.contributor.affiliatedAuthorChung, Haseung-
dc.contributor.affiliatedAuthorShin, Seungwon-
dc.contributor.affiliatedAuthorSeo, Jung Hwan-
dc.identifier.doi10.1038/srep22752-
dc.identifier.scopusid2-s2.0-84960444824-
dc.identifier.wosid000371462000001-
dc.identifier.bibliographicCitationSCIENTIFIC REPORTS, v.6-
dc.relation.isPartOfSCIENTIFIC REPORTS-
dc.citation.titleSCIENTIFIC REPORTS-
dc.citation.volume6-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalWebOfScienceCategoryMultidisciplinary Sciences-
dc.subject.keywordPlusCRYSTALLINE SILICON-
dc.subject.keywordPlusBOWING PHENOMENON-
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