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IoT디바이스와 클라우드 환경을 이용한 공정이상 탐지 및 분류 프레임웍 및 구현Framework and Development of Fault Detection Classification using IoT Device and Cloud Environment
- Other Titles
- Framework and Development of Fault Detection Classification using IoT Device and Cloud Environment
- Authors
- Lee,Hyun Soo
- Issue Date
- Apr-2017
- Publisher
- Elsevier
- Citation
- Journal of Manufacturing Systems, v.43, no.2, pp.257 - 270
- Journal Title
- Journal of Manufacturing Systems
- Volume
- 43
- Number
- 2
- Start Page
- 257
- End Page
- 270
- ISSN
- 0278-6125
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Collections - School of Industrial Engineering > 1. Journal Articles
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Related Researcher
- LEE, Hyunsoo
- College of Engineering (Department of Industrial Engineering)