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CCFL 검사를 위한 촬영조건 및 불량판별 알고리즘
- Authors
- kim, Byeong-Man
- Issue Date
- 23-Apr-2010
- Publisher
- 한국정보처리학회
- Citation
- 제33회 춘계학술발표대회, v.17, no.1, pp.365-368
- Conference Name
- 제33회 춘계학술발표대회
- Place
- KO
강원대학교(춘천캠퍼스)
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Collections - Department of Computer Software Engineering > 2. Conference Papers
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Related Researcher
- KIM, BYEONG MAN
- College of Engineering (Department of Computer Software Engineering)