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Effects of incomplete ionization on forward current-voltage characteristics of p-type diamond Schottky barrier diodes based on numerical simulation

Authors
Seok, OgyunHa, Min-Woo
Issue Date
1-Jun-2021
Publisher
IOP PUBLISHING LTD
Keywords
diamond; diode; incomplete ionization; forward voltage drop; carrier activation
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS, v.60, no.SC
Journal Title
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume
60
Number
SC
URI
https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/19317
DOI
10.35848/1347-4065/abf2a7
ISSN
0021-4922
1347-4065
Abstract
The forward current-voltage characteristics of p-type diamond pseudo-vertical Schottky barrier diodes are investigated via numerical simulation. Impact ionization decrease the hole concentration of the p- drift layer from 10(15) to 10(14) cm(-3) at 300 K, thereby increasing the forward voltage drop and on-resistance. When we consider an incomplete ionization with increasing temperature, the increase in the hole concentration is more dominant than the enhanced phonon scattering, thereby resulting in an increasing forward current. We modified the Ohmic contact for both metallic conduction at the p+ layer and incomplete ionization at the p- drift layer. The Baliga figure-of-merit of the device with and without incomplete ionization is 25 and 192 MW cm(-2), respectively. Incomplete ionization should be considered in the numerical study of diamond power devices.
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