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MEASUREMENT OF AFM CANTILEVER SPRING CONSTANT BY USING THE SURFACE PROFILE

Authors
Kweon, HyunkyuNam, Kiho
Issue Date
20-Jul-2010
Publisher
WORLD SCIENTIFIC PUBL CO PTE LTD
Keywords
Cantilever stiffness; atomic force microscopy (AFM); surface profile measurement; step profile slope
Citation
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, v.24, no.18, pp 3597 - 3606
Pages
10
Journal Title
INTERNATIONAL JOURNAL OF MODERN PHYSICS B
Volume
24
Number
18
Start Page
3597
End Page
3606
URI
https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/22312
DOI
10.1142/S0217979210054865
ISSN
0217-9792
1793-6578
Abstract
This study introduces a new method of measuring the stiffness (spring constant) of cantilevers that is designed to improve the measurement accuracy of (atomic force microscopy) (AFM). AFM cantilever spring constants are determined by the relation between the slope of the step height ascertained from the surface profile measurement results, and the size of the cantilever. The surface profile measurements of the standard specimens with three different step heights (height: 100, 500, and 1000 nm) were conducted using a standard cantilever with different stiffness. As a result of this exercise, the profile slope was found to be proportional to cantilever stiffness, and the necessity was uncovered to conduct a similar experiment in order to clarify the quantitative relation between stiffness and the profile slope when the same kind of cantilever is utilized.
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