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Measurements of the in-plane coefficient of thermal expansion of freestanding single-crystal natural graphite

Authors
Mag-isa, Alexander E.Kim, Jae-HyunOh, Chung-Seog
Issue Date
15-May-2016
Publisher
ELSEVIER SCIENCE BV
Keywords
Exfoliated natural graphite; Freestanding; Single-crystal graphite; Negative thermal expansion coefficient
Citation
MATERIALS LETTERS, v.171, pp 312 - 314
Pages
3
Journal Title
MATERIALS LETTERS
Volume
171
Start Page
312
End Page
314
URI
https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/22505
DOI
10.1016/j.matlet.2016.02.110
ISSN
0167-577X
1873-4979
Abstract
The in-plane coefficient of thermal expansion (CTE) of freestanding single-crystal natural graphite was directly determined using the thermal bulge method. The Scotch tape method was used to obtain 40nm-thick graphite flakes by the micromechanical cleavage of high-quality graphite flakes. The naturally bulged shape of the samples enabled us to easily measure the CTE without any need for transfer or additional processes. The measured CTE was negative and gradually decreased in magnitude from 1.8 x 10(-6)/degrees C to 0.7 x 10(-6)/degrees C when the samples were heated from 25 degrees C to 225 degrees C. (C) 2016 Elsevier B.V. All rights reserved.
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