화상처리를 이용한 OLED 디스플레이의 픽셀 불량 검사에 관한 연구Defect Inspection of the Pixels in OLED Type Display Device by Image Processing
- Other Titles
- Defect Inspection of the Pixels in OLED Type Display Device by Image Processing
- Authors
- 박경석; 신동원
- Issue Date
- 2009
- Publisher
- 한국기계가공학회
- Keywords
- Image Processing(화상 처리); Inspection Devices(검사장비); OLED Display(유기발광 디스플레이); Line Scanning Camera(라인스캔 카메라); Display Pixel(디스플레이 픽셀)
- Citation
- 한국기계가공학회지, v.8, no.2, pp 22 - 28
- Pages
- 7
- Journal Title
- 한국기계가공학회지
- Volume
- 8
- Number
- 2
- Start Page
- 22
- End Page
- 28
- URI
- https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/22987
- ISSN
- 1598-6721
2288-0771
- Abstract
- The image processing methods are widely used in many industrial fields to detect defections in inspection devices. In this study an image processing method was conducted for the detection of abnormal pixels in a OLED(Organic Light Emitting Diode) type panel which is used for small size displays. The display quality of an OLED device is dependent on the pixel formation quality. So, among the so many pixels, to find out the faulty pixels is very important task in manufacturing processing or inspection division. We used a line scanning type BW(Black & White) camera which has very high resolution characteristics to acquire an image of display pixel patterns. And the various faulty cases in pixel abnormal patterns are considered to detect abnormal pixels. From the results of the research, the normal BW pixel image could be restored to its original color pixel.
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Collections - School of Mechanical System Engineering > 1. Journal Articles
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