Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
A New Calibration Method of Atomic Force MicroscopyA New Calibration Method of Atomic Force Microscopy
- Other Titles
- A New Calibration Method of Atomic Force Microscopy
- Authors
- Kweon, Hyun-Kyu
- Issue Date
- Jul-2001
- Publisher
- Korean Society of Precision Engineering
- Citation
- International Journal of the K.S.P.E, v.2, no.2, pp 11 - 16
- Pages
- 6
- Journal Title
- International Journal of the K.S.P.E
- Volume
- 2
- Number
- 2
- Start Page
- 11
- End Page
- 16
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - School of Mechanical System Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.