태양광 발전시스템의 신뢰성 향상을 위한 태양전지의 PID 저감 기술의 타당성 검토A Study on Validity of Anti-PID Technology of Solar Cell for the High Reliability of Photovoltaics System
- Other Titles
- A Study on Validity of Anti-PID Technology of Solar Cell for the High Reliability of Photovoltaics System
- Authors
- 백성선; 백승엽; 정태욱; 조진형
- Issue Date
- Feb-2013
- Publisher
- 한국산업경영시스템학회
- Keywords
- Solar cell; PID; Reliability; Photovoltaics system
- Citation
- 한국산업경영시스템학회지, v.36, no.2, pp 32 - 38
- Pages
- 7
- Journal Title
- 한국산업경영시스템학회지
- Volume
- 36
- Number
- 2
- Start Page
- 32
- End Page
- 38
- URI
- https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/27782
- DOI
- 10.11627/jkise.2013.36.2.32
- ISSN
- 2005-0461
- Abstract
- In recent years, anti-PID (Potential Induced Degradation) technologies have been studied and developed at various stages throughout the solar value chain from solar cells to systems in an effort to enhance long-term reliability of the photovoltaics (PV) system. Such technologies and applications must bring in profits economically for both manufacturers of solar cell/module and investors of PV systems, simultaneously for the development of the PV industry.
In this study two selected anti-PID technologies, ES (modification of emitter structure) and ARC (modification of anti-reflective coating) were compared based on the economic features of both a cell maker with 60MW production capacity and an investor of 1MW PV power plant. As a result of this study, it is shown that ARC anti-PID technology can ensure more profits over ES technology for both the cell manufacturer and the investor of PV power plant.
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