APPLICATION OF THE BIFOCUSING METHOD IN MICROWAVE IMAGING WITHOUT BACKGROUND INFORMATION
- Authors
- Son, Seong-ho; Park, Won-kwang
- Issue Date
- Aug-2023
- Publisher
- KOREAN SOC INDUSTRIAL & APPLIED MATHEMATICS
- Keywords
- Key words and phrases; Bifocusing Method; Scattering Parameter; Microwave Imaging; Background Information
- Citation
- JOURNAL OF THE KOREAN SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, v.27, no.2, pp 109 - 122
- Pages
- 14
- Journal Title
- JOURNAL OF THE KOREAN SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS
- Volume
- 27
- Number
- 2
- Start Page
- 109
- End Page
- 122
- URI
- https://scholarworks.bwise.kr/sch/handle/2021.sw.sch/25409
- DOI
- 10.12941/jksiam.2023.27.109
- ISSN
- 1226-9433
1229-0645
- Abstract
- . In this study, we consider the application of the bifocusing method (BFM) for identifying the locations and shapes of small anomalies from scattering parameter data when the exact values of background permittivity and conductivity are unknown. To this end, an imaging function using numerical focusing operator is introduced and its mathematical structure is revealed by establishing a relationship with an infinite series of Bessel functions, antenna arrangements, and anomaly properties. On the basis of the revealed structure, we demonstrate why inaccurate location and size of anomalies were retrieved via the BFM. Some simulation results are illustrated using synthetic data polluted by random noise to support the theoretical result.
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Collections - College of Engineering > Department of Mechanical Engineering > 1. Journal Articles
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