External Resistor-Free Gate Configuration Phase Transition FDSOI MOSFETopen access
- Authors
- Shin, J[Shin, Jaemin]; Shin, C[Shin, Changhwan]
- Issue Date
- 2019
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Phase transition FET; steep switching devices; FDSOI; threshold selector
- Citation
- IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.7, no.1, pp.186 - 190
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
- Volume
- 7
- Number
- 1
- Start Page
- 186
- End Page
- 190
- URI
- https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/16207
- DOI
- 10.1109/JEDS.2018.2888888
- ISSN
- 2168-6734
- Abstract
- Gate configuration phase transition fully depleted silicon-on-insulator (FDSOI) metal-oxide-semiconductor field-effect transistor (MOSFET) without an external resistor is proposed using Pb(Zr0.52Ti0.48)O-3 (PZT)-based threshold selector (TS). Under 1 mu A compliance current condition, the PZT-based TS exhibits its threshold switching property at similar to 0.9 V (threshold voltage) and similar to 0.01 V (hold voltage) over similar to 4 orders of current. And its off-resistance is measured as similar to 2.3 x 10(11) Omega. The PZT-based gate configuration phase transition FDSOI MOSFET without an external resistor was fabricated by connecting the PZT-based TS to a baseline FDSOI MOSFET. It is confirmed that the fabricated external resistor-free phase transition FDSOI MOSFET can operate regardless of the aforementioned 1 mu A of compliance current condition. This device has not only demonstrated the feature of similar to 4 mV/decade subthreshold slope at similar to 0.96 V of gate voltage, but it also has decreased the gate leakage current of the baseline FDSOI MOSFET by similar to 10 times at 0 V of gate voltage and similar to 320 times at 2 V of gate voltage.
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Collections - Information and Communication Engineering > School of Electronic and Electrical Engineering > 1. Journal Articles
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