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Cited 18 time in webofscience Cited 17 time in scopus
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Nonlinear third harmonic generation at crystalline sapphiresopen access

Authors
Yi, G[Yi, Gao]Lee, H[Lee, Hyub]Jiannan, J[Jiannan, Jiao]Chun, BJ[Chun, Byung Jae]Han, S[Han, Seunghwoi]Kim, H[Kim, Hyunwoong]Kim, YW[Kim, Yong Woo]Kim, D[Kim, Donghwan]Kim, SW[Kim, Seung-Woo]Kim, YJ[Kim, Young-Jin]
Issue Date
16-Oct-2017
Publisher
OPTICAL SOC AMER
Citation
OPTICS EXPRESS, v.25, no.21, pp.26002 - 26010
Indexed
SCIE
SCOPUS
Journal Title
OPTICS EXPRESS
Volume
25
Number
21
Start Page
26002
End Page
26010
URI
https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/26897
DOI
10.1364/OE.25.026002
ISSN
1094-4087
Abstract
Third harmonic generation (THG) is a nonlinear optical phenomenon which can be applied in diverse research areas including interfacial studies, sub-wavelength light manipulation, and high sensitivity bio-molecular detection. Most precedent studies on THG have focused on dielectric and metallic materials, including silicon, gold, and germanium, due to their high nonlinear susceptibility. Sapphire, a widely-used optical substrate, has not been studied in depth for its third harmonic characteristics, despite its excellent optical transmission in the UV-visible range, high thermal conductance, and superior physical and chemical stability. In this research, we comprehensively studied THG at thin air-dielectric interfaces of sapphire wafers by controlling the wafer cutting planes, focusing depth, incidence angle, laser intensity, and input polarization of the input laser beam. These findings can lead to broader use of third harmonics for high-precision sapphire characterization, such as surface quality inspection, crystallinity determination, interfacial studies, delamination check, and real-time monitoring of crack propagation. (C) 2017 Optical Society of America
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