Jang, B.[Jang, B.]; Hayder, A.S.[Hayder, A.S.]; Do, S.[Do, S.]; Cho, S.[Cho, S.]; Lee, D.[Lee, D.]; Pu, Y.[Pu, Y.]; Hwang, K.C.[Hwang, K.C.]; Yang, Y.[Yang, Y.]; Lee, K.-Y.[Lee, K.-Y.]
ArticleIssue Date2017CitationMICROELECTRONICS JOURNAL, v.62, pp.79 - 84PublisherELSEVIER SCI LTD