Fan, X.[Fan, X.]; Rabelo, M.[Rabelo, M.]; Hu, Y.[Hu, Y.]; Khokhar, M.Q.[Khokhar, M.Q.]; Kim, Y.[Kim, Y.]; Yi, J.[Yi, J.]
ArticleIssue Date2023CitationTransactions on Electrical and Electronic Materials, v.24, no.2, pp.123 - 131PublisherKorean Institute of Electrical and Electronic Material Engineers