Lee, JM[Lee, Jong-Min]; Park, DS[Park, Dong-Sik]; Yew, SC[Yew, Seung-chul]; Shin, SH[Shin, Soo-Ho]; Noh, JY[Noh, Jun-Yong]; Kim, HS[Kim, Hyoung-Sub]; Choi, BD[Choi, Byoung-Deog]
ArticleIssue Date2017CitationIEEE ELECTRON DEVICE LETTERS, v.38, no.11, pp.1524 - 1527PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC