Kim, HJ[Kim, H. J.]; Park, JM[Park, J. M.]; Byun, CW[Byun, C. W.]; Bak, SR[Bak, S. R.]; Jung, YJ[Jung, Y. J.]; Han, CH[Han, C. H.]; Yoo, JM[Yoo, J. M.]; Kim, SK[Kim, S. K.]; Choi, PH[Choi, P. H.]; Lee, JH[Lee, J. H.], et al.
ArticleIssue Date2021CitationELECTRONICS LETTERS, v.57, no.19, pp.744 - 746PublisherWILEY